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Figure 5: Characterization of the SEI components of deposited Li by XPS. XPS depth profiles of F1s spectra of deposited Li before and after 1 min Ar sputtering in (a) 1m electrolyte at 27°C, (b) 1m electrolyte at 60°C, (c) 3m electrolyte at 27°C, and (d) 3m electrolyte at 60°C.