Skip to main content

Research Article

Characterization of Ablation Thresholds for 3D-Cultured Patient-Derived Glioma Stem Cells in Response to High-Frequency Irreversible Electroporation

J. W. Ivey1, E. M. Wasson2, N. Alinezhadbalalami1, A. Kanitkar1, W. Debinski3, Z. Sheng4,5,6, R. V. Davalos1,2,3,6, and S. S. Verbridge1,2,3,6,*

1School of Biomedical Engineering and Sciences, Virginia Tech-Wake Forest University, Blacksburg, VA 24061, USA
2Department of Mechanical Engineering, Virginia Tech, Blacksburg, VA 24061, USA
3Brain Tumor Center of Excellence, Comprehensive Cancer Center, Wake Forest Baptist Medical Center, Winston-Salem, NC 27157, USA
4Virginia Tech Carilion Research Institute, Roanoke, VA 24061, USA
5Department of Internal Medicine, Virginia Tech Carilion School of Medicine, Roanoke, VA 24016, USA
6Faculty of Health Science, Virginia Tech, Blacksburg, VA 24061, USA
*Correspondence should be addressed to S. S. Verbridge; sverb@vt.edu

How to Cite this Article

J. W. Ivey, E. M. Wasson, N. Alinezhadbalalami, et al., “Characterization of Ablation Thresholds for 3D-Cultured Patient-Derived Glioma Stem Cells in Response to High-Frequency Irreversible Electroporation,” Research, vol. 2019, Article ID 8081315, 14 pages, 2019. https://doi.org/10.34133/2019/8081315.

  • Views 711
  • Citations 0
Altmetric Attention Score
Find out more